Summaries - Office of Research & Innovation
Research Summaries
Back Gallium Nitride HEMT Reliability Analysis
Fiscal Year | 2009 |
Division | Graduate School of Engineering & Applied Science |
Department | Electrical & Computer Engineering |
Investigator(s) | Weatherford, Todd R. |
Sponsor | Air Force Research Laboratory (Air Force) |
Summary | Investigate the reliability of GaN HEMT devices for electrical and thermal performance. |
Keywords | |
Publications | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |
Data | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |