Research Summaries

Back IGBT Reliability Investigations

Fiscal Year 2010
Division Graduate School of Engineering & Applied Science
Department Electrical & Computer Engineering
Investigator(s) Weatherford, Todd R.
Sponsor Office of Naval Research (Navy)
Summary To investigate the degradation and failure of insulated gate bipolar transistors under various switching conditions, via device/circuit modeling and measurements.
Keywords
Publications Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal
Data Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal