Summaries - Office of Research & Innovation
Research Summaries
Back IGBT Reliability Investigations
Fiscal Year | 2010 |
Division | Graduate School of Engineering & Applied Science |
Department | Electrical & Computer Engineering |
Investigator(s) | Weatherford, Todd R. |
Sponsor | Office of Naval Research (Navy) |
Summary | To investigate the degradation and failure of insulated gate bipolar transistors under various switching conditions, via device/circuit modeling and measurements. |
Keywords | |
Publications | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |
Data | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |