Fiscal Year	2013
Division	Graduate School of Engineering & Applied Science
Department	Electrical & Computer Engineering
Investigator(s)	Weatherford, Todd R.
Sponsor	Air Force Research Laboratory (Air Force)
Summary	The proposal is to investigate end-of-life (EOL) reliability of Gallium Nitride (GaN) based High Electron Mobility Transistors (HEMTs). Uneven distributions of EOL reliability has GaN technology to transition to DoD systems. Deliverables will be electronically transmitted and will include theses, reports and other publications. This proposal is follow-on work from FY10 and part of FY11.
Keywords
Publications	Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal
Data	Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal