Summaries - Office of Research & Innovation
Back Transport Imaging for Diffusion Length Characterization of CDTE
|Division||Graduate School of Engineering & Applied Science|
|Investigator(s)||Haegel, Nancy M.|
|Sponsor||GE Global Research (Other)|
NPS will utilize its unique transport imaging capability (a JEOL 840A SEM with an attached optical microscope) to image luminescence from materials provided by GE Global Research.
Between samples will be provided by GE Global Research and NPS will perform preliminary transport imaging experiments in which spatially resolved images will be acquired under electron beam excitation. NPS will acquire, process, and present the results.
|Publications||Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal|
|Data||Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal|