Summaries - Office of Research & Innovation
Research Summaries
Back Utilizing Semiconductor Light Emission for Current Measurement Temperature Measurement and Reliability Assessment
Fiscal Year | 2021 |
Division | Graduate School of Engineering & Applied Science |
Department | Electrical & Computer Engineering |
Investigator(s) | Weatherford, Todd R. |
Sponsor | Office of Naval Research (Navy) |
Summary | Monitoring light emission from a power transistor switch (GaN or SiC) to measure the on-state current and an accurate measurement of the device junction temperature. At the same time, measuring light emission could determine the defects of the device over long-term and thus provide a state of health for prognosis and improved reliability to prevent catastrophe system failures, and efficient maintenance of power systems |
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Publications | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |
Data | Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal |