Research Summaries

Back Utilizing Semiconductor Light Emission for Current Measurement Temperature Measurement and Reliability Assessment

Fiscal Year 2021
Division Graduate School of Engineering & Applied Science
Department Electrical & Computer Engineering
Investigator(s) Weatherford, Todd R.
Sponsor Office of Naval Research (Navy)
Summary Monitoring light emission from a power transistor switch (GaN or SiC) to measure the on-state current and an accurate measurement of the device junction temperature. At the same time, measuring light emission could determine the defects of the device over long-term and thus provide a state of health for prognosis and improved reliability to prevent catastrophe system failures, and efficient maintenance of power systems
Keywords
Publications Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal
Data Publications, theses (not shown) and data repositories will be added to the portal record when information is available in FAIRS and brought back to the portal